Aging effects in low pressure wire chambers containing TMAE
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 35 (1) , 493-497
- https://doi.org/10.1109/23.12772
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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