Open-circuit to short-circuit switching: method for lifetime measurement in solar cells
- 19 July 1979
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 15 (15) , 456-458
- https://doi.org/10.1049/el:19790328
Abstract
A new method is suggested for measurement of lifetime of photoinjected carriers in the base layer of a p-n junction solar cell. The cell is switched from the open-circuit to the shortcircuit mode of operation by using a negative voltage pulse. C.R.O. trace of the output voltage pulse provides a direct means for lifetime measurement.Keywords
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