Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics

• 1 March 1999
• journal article
• research article
• Published by Wiley in Advanced Materials
• Vol. 11  (3) , 261-264
• https://doi.org/10.1002/(sici)1521-4095(199903)11:3<261::aid-adma261>3.0.co;2-b

Abstract

Keywords

• ATOMIC FORCE MICROSCOPY
• MOLECULAR ELECTRONICS