An electron microscope and field ion microscope study of defects in quenched platinum
- 1 January 1968
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 2 (1) , 69-72
- https://doi.org/10.1016/0036-9748(68)90172-5
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Electropolishing of Platinum Foils at −35°C for Transmission Electron MicroscopyJournal of Applied Physics, 1967
- COMPUTER-SIMULATED ION-EMISSION IMAGES OF DISLOCATIONS: SCREW DISLOCATION AT THE CENTER OF {420}Applied Physics Letters, 1966
- Field Ion Microscopic Observations of Dislocation Structures at Grain BoundariesJournal of Applied Physics, 1966
- Diffraction Contrast from Small Voids as Observed by Electron MicroscopyPhysica Status Solidi (b), 1965
- On diffraction contrast from inclusionsPhilosophical Magazine, 1963
- Surface self diffusion and surface energy measurements on platinum by the multiple scratch methodActa Metallurgica, 1962
- Das FeldionenmikroskopThe European Physical Journal A, 1951