Large strains in the epitaxy of Cu on Pt{001}

Epitaxial pseudomorphic films of Cu have been grown on Pt{001} to thicknesses of 15–17 layers. A quantitative low-energy electron-diffraction intensity analysis of a ten-layer film reveals that the in-plane lattice constant is that of the Pt{001}1×1 net (${\mathit{a}}_0$=3.93 Å), and that the bulk interlayer spacing is 1.62±0.04 Å. Strain analysis shows that this structure is derived from the fcc structure of Cu with a plane strain of about 9%, similar to Cu films grown on Pd{001}.