Polarization/radiometric based material classification
- 7 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 387-395
- https://doi.org/10.1109/cvpr.1989.37876
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Classification Of Material Surfaces Using The Polarization Of Specular HighlightsPublished by SPIE-Intl Soc Optical Eng ,1989
- The measurement of highlights in color imagesInternational Journal of Computer Vision, 1988
- Theory for Off-Specular Reflection From Roughened Surfaces*Journal of the Optical Society of America, 1967