Electrochemical method for detecting breakdown defects in thin insulating films on metals
- 31 January 1976
- journal article
- Published by Elsevier in Surface Technology
- Vol. 4 (1) , 31-40
- https://doi.org/10.1016/0376-4583(76)90015-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The interpretation of impedance measurements on oxide-coated aluminium part 2. The effect of flaws in As-formed filmsThin Solid Films, 1973
- Electrical Breakdown in SolidsPublished by Elsevier ,1969
- Electrograph Method for Locating Pinholes in Thin Silicon Dioxide FilmsJournal of the Electrochemical Society, 1967
- Determination of Barrier Layer Thickness of Anodic Oxide CoatingsJournal of the Electrochemical Society, 1954