Second-Harmonic Microscopy — New Tool for the Remote Sensing of Interfaces
- 1 May 1999
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 173 (1) , 15-27
- https://doi.org/10.1002/(sici)1521-396x(199905)173:1<15::aid-pssa15>3.0.co;2-8
Abstract
No abstract availableKeywords
This publication has 25 references indexed in Scilit:
- Coherence effects in second-harmonic interface imagingJournal of the Optical Society of America B, 1998
- Second-harmonic imaging of surface order and symmetryThin Solid Films, 1998
- Surface order and symmetry determined by second-harmonic microscopySupramolecular Science, 1997
- Molecular surface orientation field of a langmuir monolayer determined by second‐harmonic microscopyAdvanced Materials, 1997
- Polarization microscopy to study birefringent ultrathin filmsThe Journal of Physical Chemistry, 1994
- In situ imaging of Langmuir monolayers by second-harmonic microscopyThin Solid Films, 1994
- Optische Frequenzverdopplung zur Analyse von OberflächenPhysikalische Blätter, 1993
- Optical second harmonic generation in Langmuir-Blodgett films of novel donor-acceptor substituted pyridine and benzene derivativesFerroelectrics, 1989
- Phenomenological treatment of surface second-harmonic generationJournal of the Optical Society of America B, 1988
- Continuous-wave second-harmonic generation as a surface microprobeOptics Letters, 1986