Micron and Submicron Particle Production
- 1 July 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Industry Applications
- Vol. IA-10 (4) , 508-510
- https://doi.org/10.1109/TIA.1974.349187
Abstract
In many fields of industrial interest, particle sampling and/or control is very important. However, the calibration and testing of sampling equipment have been difficult because of the lack of sources of uniform particles. In this paper a source of uniform solid or liquid particles is described together with the characteristics of the source and the particles produced. Fractional standard deviations of 10-3 in particle-size distribution are readily obtainable. The particles may be uncharged or charged to a predetermined level. Uses include the fields of aerosol sampling equipment testing, precipitator development and testing, as well as many others.Keywords
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