Design, fabrication, and wafer level testing of (NiFe/Cu)/sub xn/ dual stripe GMR sensors
- 1 January 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 33 (5) , 2905-2907
- https://doi.org/10.1109/20.617793
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- GMR multilayers and head design for ultrahigh density magnetic recordingIEEE Transactions on Magnetics, 1996
- Micromagnetics of GMR multilayer sensors at high current densitiesIEEE Transactions on Magnetics, 1994
- Highly sensitive giant magnetoresistance in NiFe/(Ni/Fe/Cu)/sub n//NiFe thin filmsIEEE Transactions on Magnetics, 1994
- Magnetoresistive heads for ultra high density recordingIEEE Transactions on Magnetics, 1993