Revised X-ray diffraction line intensities for silicon carbide polytypes

• 2 June 1969
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 2  (2) , 45-48
• https://doi.org/10.1107/s0021889869006510

Abstract

Keywords

• SILICON CARBIDE
• REVISED INTENSITY
• INTENSITY RELATIONSHIPS
• 15R
• CARBIDE POLYTYPES
• POLYTYPE SAMPLES