AES and XPS depth profiling certified reference material
- 1 April 1984
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 6 (2) , 92-93
- https://doi.org/10.1002/sia.740060211
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Characterization of a high depth‐resolution tantalum pentoxide sputter profiling reference materialSurface and Interface Analysis, 1983