An Improved Bound on the Length of Checking Experiments for Sequential Machines with Counter Cycles

1 June 1972

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. C-21 (6) , 597-598
https://doi.org/10.1109/tc.1972.5009016

Abstract

The bound on the length of checking experiments derived by Murakami et al. [1] is improved by using a more efficient output specification in the counter cycle.

Keywords

RADIATION DETECTORS
SHIFT REGISTERS
SEQUENTIAL CIRCUITS
DATA MINING
SWITCHING CIRCUITS
FAULT DIAGNOSIS

This publication has 2 references indexed in Scilit:

Sequential Machines Capable of Fault Diagnosis
IEEE Transactions on Computers, 1970
Fault detecting experiments for sequential circuits
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1964