Ellipsometric determination of the optical constants of C60 (Buckminsterfullerene) films

Abstract
We report the first ellipsometric measurement of the fundamental optical constants (n,k) of C60 films deposited on Si(100) and Au overcoated Si(100) substrates. We obtain a highest occupied molecular orbital‐lowest unoccupied molecular orbit (HOMO‐LUMO) gap value of 2.3 eV, slightly larger than the gap values obtained from the x‐ray photoelectron spectroscopy and electron‐energy‐loss spectroscopy experiments. The structure observed in the UV is discussed in terms of single‐electron excitations across the HOMO‐LUMO gap.