A double-slit interferometer for the determination of the thickness of the reference system used in X-ray microradiography
- 1 January 1953
- journal article
- research article
- Published by Elsevier in Experimental Cell Research
- Vol. 5 (2) , 301-310
- https://doi.org/10.1016/0014-4827(53)90214-6
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Determination by interferometric methods of the thickness of the reference system used in microradiographyExperimental Cell Research, 1952
- X-ray microradiography as a quantitative methodBiochimica et Biophysica Acta, 1951