Interference enhanced Raman scattering from very thin absorbing films
- 1 January 1980
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 36 (1) , 31-33
- https://doi.org/10.1063/1.91304
Abstract
A new method of obtaining Raman spectra from a very thin highly absorbing films (α≳105 cm−1) is described. The technique which is termed interference enhanced Raman scattering (IERS) is shown theoretically to produce a gain in the scattered intensity of 10–103 (depending on the optical constants of the material) over that expected from a thick sample using the conventional Raman backscattering configuration. The potential of the method is demonstrated experimentally using tellurium, and a gain of 20 is obtained.Keywords
This publication has 1 reference indexed in Scilit:
- Theory of the resonance Raman effect in crystalsJournal de Physique, 1965