Series resistance caused by the localized rear contact in high efficiency silicon solar cells
- 31 January 1994
- journal article
- Published by Elsevier in Solar Energy Materials and Solar Cells
- Vol. 32 (1) , 89-94
- https://doi.org/10.1016/0927-0248(94)90258-5
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Spreading resistance of a round ohmic contactSolid-State Electronics, 1993
- High‐efficiency silicon solar cells: Full factor limitations and non‐ideal diode behaviour due to voltage‐dependent rear surface recombination velocityProgress In Photovoltaics, 1993
- 24% efficient silicon solar cellsApplied Physics Letters, 1990
- Characterization of 23-percent efficient silicon solar cellsIEEE Transactions on Electron Devices, 1990