A Scanning-Angle Reflectometry Study of Surfaces Covered with Latex Particles
- 1 June 1993
- journal article
- Published by IOP Publishing in Europhysics Letters
- Vol. 22 (7) , 543-548
- https://doi.org/10.1209/0295-5075/22/7/011
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Total internal reflection microscopy: a quantitative tool for the measurement of colloidal forcesLangmuir, 1990
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- The polarizability of a truncated sphere on a substrate IPhysica A: Statistical Mechanics and its Applications, 1987
- Light reflection from a substrate sparsely seeded with spheres - comparison with an ellipsometric experimentPhysica A: Statistical Mechanics and its Applications, 1986
- Light scattering by a sphere on a substratePhysica A: Statistical Mechanics and its Applications, 1986