Statistical design centring for electrical circuits

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Abstract
The problem of maximising the manufacturing yield of electrical circuits is addressed. Within the constraint that the absolute component tolerances and the forms of their statistical distributions are fixed, a new design-centring procedure is developed and illustrated by example. It is directly applicable to the design of discrete circuits where fixed tolerances are often considered. The assumption of fixed tolerances also suggests its relevance (as yet untested) to the design of integrated circuits.

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