The effect of substrate temperature and grain boundary scattering on the electrical resistivity of thin samarium films
- 16 October 1981
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 67 (2) , K119-K122
- https://doi.org/10.1002/pssa.2210670254
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Workshop notes and short contributionsVacuum, 1981
- Electrical properties of thin samarium filmsJournal of the Less Common Metals, 1980
- Rare earth metals, rare earth hydrides, and rare earth oxides as thin films a critical reviewPhysica Status Solidi (a), 1980
- The electrical properties of polycrystalline tin films evaporated onto a cooled substrateThin Solid Films, 1979
- The effect of oxygen and hydrogen contamination on the electrical resistivity of rare earth metal filmsThin Solid Films, 1977
- Electrical resistivity of ytterbium thin filmsThin Solid Films, 1974
- Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External SurfacesPhysical Review B, 1970