Application of the time-of-flight technique to pressure measurements in XHV by a quadrupole mass spectrometer
- 1 June 1996
- Vol. 47 (6-8) , 575-578
- https://doi.org/10.1016/0042-207x(96)00023-1
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- The Measurement of Very-Low Partial Pressures.SHINKU, 1994
- Laser Photoionization Measurements of Pressure in Vacuum.SHINKU, 1994
- Experimental Observation of Ionization Area Inside Ionization Grid of the Vacuum Gauge.SHINKU, 1994
- Pressure measurement method using laser ionization for xhvVacuum, 1993
- Uhv and xhv pressure measurementsVacuum, 1993
- A mass filter with a cold cathodeVacuum, 1993
- Electron space charge effects in ion sources for residual gas analysisMeasurement Science and Technology, 1993
- Microfabricated field-emission and field-ionization sourcesSurface Science, 1992
- Very-low outgassing rate, separable, aluminum-flanged, hot-cathode ion source for a residual gas analyzerJournal of Vacuum Science & Technology A, 1990
- Ion current modulation of a residual gas analyzerJournal of Vacuum Science & Technology A, 1985