Orthogonal defect classification-a concept for in-process measurements
- 1 January 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Software Engineering
- Vol. 18 (11) , 943-956
- https://doi.org/10.1109/32.177364
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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