A variable observation time method for testing delay faults

Publisher Website

4 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/dac.1990.114949

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

On the detection of delay faults
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
A simplified six-waveform type method for delay fault testing
Published by Association for Computing Machinery (ACM) ,1989