New method for determining the nonlinear optical coefficients of thin films
- 13 July 1992
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 61 (2) , 145-146
- https://doi.org/10.1063/1.108199
Abstract
A new scheme for characterizing the quadratic optical nonlinearity of thin films grown on opaque substrates is proposed and demonstrated. This involved the measurement, as a function of the film thickness, of second‐harmonic waves reflected from a film surface. The d36 coefficient of a ZnSe‐on‐GaAs film is estimated by this method to be 33±7 pm/V at the fundamental wavelength of 1.06 μm, which agrees reasonably well with the known value for the bulk crystal.Keywords
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