Fault Identification in Electronic Circuits with the Aid of Bilinear Transformations
- 1 May 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-21 (2) , 99-104
- https://doi.org/10.1109/tr.1972.5215954
Abstract
A method has been developed for applying bilinear transformations to the identification of faulty components in linear electronic circuits. Simple magnitude and phase measurements, at a number of test frequencies, are made and plotted on a set of predetermined loci in the complex transfer-function plane. The data for plotting the loci are determined either experimentally or by circuit analysis with a digital computer. The faulty component and the parameter value are then determined from the loci. The method has the advantage that it provides a graphical representation of the circuit behavior with a faulty component and also readily allows experimental error to be taken into account when plotting the measured data. The method is demonstrated with a practical transistor amplifier circuit.Keywords
This publication has 4 references indexed in Scilit:
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- Fault Isolation in Conventional Linear SystemsߞA Feasibility StudyIEEE Transactions on Reliability, 1966
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