Some modifications of the scanning electron microscope for use in electron channelling patterns observation
- 1 April 1970
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 3 (4) , 323-326
- https://doi.org/10.1088/0022-3735/3/4/425
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Optimum conditions for generating channelling patterns in the scanning electron microscopeJournal of Physics E: Scientific Instruments, 1969
- Further comments on the origin of orientation-dependent patterns obtained in the scanning electron microscopeJournal of Physics E: Scientific Instruments, 1969
- Some comments on the interpretation of the ‘kikuchi-like reflection patterns’ observed by scanning electron microscopyPhilosophical Magazine, 1967
- Kikuchi-like reflection patterns obtained with the scanning electron microscopePhilosophical Magazine, 1967
- Secondary electron emission: Part II. Absorption of secondary electronsPhysica, 1938