High-temperature superconductor edge-geometry SNS junctions with engineered normal-metal layers

Abstract
High-temperature superconductor Josephson junctions in an edge-geometry superconductor - normal-metal - superconductor (SNS) configuration were fabricated on substrates. The normal metal was composed of an engineered multilayer with different Pr-doping concentrations (x = 0.1, 0.3, or 0.5). Scanning tunnelling microscopy analysis on thin films provided supporting evidence for the use of such an engineered multilayer as N barrier to fabricate edge-geometry SNS junctions. The improved S - N or N - S interface, as revealed by cross-sectional transmission electron microscopy, explains the negligible interface resistance of the junctions.