Characterization of Thin Films by X-Ray Fluorescence and Diffraction Analysis
- 1 January 1979
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- The theoretical derivation of fluorescent X-ray intensities from mixturesPublished by Elsevier ,2002
- Scherrer after sixty years: A survey and some new results in the determination of crystallite sizeJournal of Applied Crystallography, 1978
- Qualitative Analysis of Complicated Mixtures by Profile Fitting X-Ray Diffractometer PatternsPublished by Springer Nature ,1978
- Simultaneous determination of composition and mass thickness of thin films by quantitative x-ray fluorescence analysisAnalytical Chemistry, 1977
- Lama I — A General Fortran Program for Quantitative X-ray Fluorescence AnalysisPublished by Springer Nature ,1977
- The design of single crystal materials for magnetic bubble domain applicationsJournal of Materials Science, 1975
- Separation of the particle size and microstrain components in the Fourier coefficients of a single diffraction profileJournal of Applied Crystallography, 1974
- Role of Diffractometer Geometry in the Standardization of Polycrystalline DataPublished by Springer Nature ,1974
- Die sekundäranregung bei der Röntgenfluoreszenzanalyse ebener dünner schichtenSpectrochimica Acta Part B: Atomic Spectroscopy, 1971
- Calculation methods for fluorescent x-ray spectrometry. Empirical coefficients versus fundamental parametersAnalytical Chemistry, 1968