Dual Bounds Variational Formulation of Skin Effect Problems
- 1 January 1987
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 1, 333-336
- https://doi.org/10.1109/mwsym.1987.1132398
Abstract
Accurate loss calculation of transmission lines is an important topic in monolithic microwave integrated circuits (MMICs). This paper describes a general variational approach for calculating dual bounds of the interesting circuit parameters. Using the dual bounds approach, the computational expense can be reduced drastically; the accuracy of the solution for the interesting circuit parameters R,L is guaranteed by the corresponding upper and lower bounds. Combined with an improved classical full-wave analysis, the method presented here is a good tool for the loss calculation due to the skin effect in microstrip like structures.Keywords
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