Characterization of intermixing at the CdS/CdTe interface in CSS deposited CdTe
- 1 January 1996
- proceedings article
- Published by AIP Publishing in AIP Conference Proceedings
- Vol. 353 (1) , 392-399
- https://doi.org/10.1063/1.49365
Abstract
CdS/CdTe structures deposited on different substrates are analyzed using transmission electron microscopy (TEM), secondary ion mass spectrometry (SIMS), optical transmission, atomic force microscopy (AFM), X‐ray diffraction (XRD) and photoluminescence (PL). The microstructure of CdTe was found to be independent of CdS crystallinity, and the structural defects at CdS/CdTe interface are generated principally by the lattice mismatch between CdS and CdTe. The interdiffusion at the CdS/CdTe interface was found to be a function of substrate temperature and CdCl2 heat treatment.Keywords
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