Electron diffraction determination of the molecular structure of tetrasilylhydrazine
- 1 January 1970
- journal article
- research article
- Published by Royal Society of Chemistry (RSC) in J. Chem. Soc. A
- p. 318-320
- https://doi.org/10.1039/j19700000318
Abstract
The structure of tetrasilylhydrazine, (SiH3)4N2, has been determined by the sector microphotometer method of electron diffraction. The data are consistent with planar Si2NN groups, and a dihedral angle of 82·5 ± 0·8°; the deviation of this angle from 90° may possibly be explained by torsional effects. The Si–H, N–Si, and N–N bond lengths are 1·487 ± 0·014, 1·731 ± 0·004, and 1·457 ± 0·016 Å respectively; the Si–N–Si angle is 129·5 ± 0·7° and the N–Si–H angle is 109·0 ± 1·4°.Keywords
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