Thickness measurements in the electron microscope
- 1 January 1967
- journal article
- other
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 44 (1) , 61
- https://doi.org/10.1088/0950-7671/44/1/416
Abstract
A probe unit and a simple electrometer circuit are described for the measurement of the electron beam currents in an electron microscope. These measurements are used to calculate the thickness of the sample in the microscope.Keywords
This publication has 2 references indexed in Scilit:
- 839. An electrometric method for measuring the thickness of the air-formed oxide film on pure iron and mild steelJournal of the Chemical Society, 1958
- Scattering Phenomena in Electron Microscope Image FormationJournal of Applied Physics, 1951