Abstract
The application of high-order diffracting vectors to the determination of Burgers vectors, b=1/2 (110) of localized dislocation configuration in copper has been examined. Perfect dislocation loops and network dislocations resulting from their interaction have been imaged in the two-beam approximation using transmission electron microscopy. Observations which combine low order, | g · b | = 1 max=1, and high-order, | g · b | ≥ 2, reflections indicate that near-invisibility can reliably be associated with the condition g · b=0 for loops independent of the order of g providing a defect has been imaged in both + g and - g keeping the deviation parameter w g approximately constant; a similar result has been found for the network dislocations although a more complete interpretation requires additional consideration. As a consequence of such observations it has been concluded that if certain precautions are exercised then the direction of b for these two configurations can reliably be assessed from a series of micrographs in which a specific diffracting vector giving rise to g · b=0, ±1 and ±2 images has been employed.

This publication has 5 references indexed in Scilit: