The measurement of low energy X-rays. V. total absorption silicon devices
- 1 January 1969
- journal article
- Published by IOP Publishing in Physics in Medicine & Biology
- Vol. 14 (1) , 55-60
- https://doi.org/10.1088/0031-9155/14/1/004
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The Measurement of Low Energy X-Rays IV: Total Absorption Ionization ChamberPhysics in Medicine & Biology, 1968
- The Measurement of Low Energy X-Rays II: Total Absorption CalorimetryPhysics in Medicine & Biology, 1968
- The Measurement of Low Energy X-Rays I: General ConsiderationsPhysics in Medicine & Biology, 1968
- Accurate determination of the ionization energy in semiconductor detectorsNuclear Instruments and Methods, 1968