Monte Carlo particle investigation of noise in short n ⁺ - n-n ⁺ GaAs diodes

• 13 October 1988
• journal article
• Published by Institution of Engineering and Technology (IET) in Electronics Letters
• Vol. 24  (21) , 1307-1308
• https://doi.org/10.1049/el:19880888

Abstract

Keywords

• NOISE CURRENT SPECTRAL DENSITY
• III-V SEMICONDUCTORS
• MONTE CARLO PARTICLE INVESTIGATION
• N+-N-N+ DIODES
• THREE-VALLEY MODEL
• GAAS
• SAMPLE LENGTH
• NOISE
• NORMALISED SPECTRAL DENSITY