Millimeter wave complex refractive index, complex dielectric permittivity and loss tangent of high purity and compensated silicon
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Precision millimeter-wave dielectric measurements of birefringent crystalline sapphire and ceramic aluminaIEEE Transactions on Instrumentation and Measurement, 1987
- Precision millimeter-wave measurements of complex refractive index, complex dielectric permittivity, and loss tangent of common polymersIEEE Transactions on Instrumentation and Measurement, 1987
- Precision Dielectric Measurements of Nonpolar Polymers in the Millimeter Wavelength RangeIEEE Transactions on Microwave Theory and Techniques, 1985
- Millimeter-wave dielectric measurement of materialsProceedings of the IEEE, 1985
- Dielectric Measurements of Millimeter-Wave MaterialsIEEE Transactions on Microwave Theory and Techniques, 1984
- Dispersive Fourier Transform Spectrometry with Variable-Thickness Variable-Temperature Liquid CellsIEEE Transactions on Microwave Theory and Techniques, 1977
- A new method for the determination of complex refractive index spectra of transparent solids in the far-infrared spectral region: Results of pure silicon and crystal quartzJournal of Physics D: Applied Physics, 1977