The resistivity and TCR of erbium films compared with the predictions of the columnar model
- 1 September 1974
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 23 (2) , S50-S52
- https://doi.org/10.1016/0040-6090(74)90247-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Exact and approximate equations for the thickness dependence of resistivity and its temperature coefficient in thin polycrystalline metal filmsThin Solid Films, 1973
- Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External SurfacesPhysical Review B, 1970
- Bestimmung der mittleren freien Weglänge der Leitungselektronen in KaliumThe European Physical Journal A, 1955