Detailed measurements and shaping of gate profiles for microchannel-plate-based X-ray framing cameras

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Abstract
Gated, microchannel-plate-based (MCP) framing cameras are increasingly used worldwide for x-ray imaging of subnanosecond laser-plasma phenomena. Large dynamic range (> 1,000) measurements of gain profiles for gated microchannel plates (MCP) are presented. Temporal profiles are reconstructed for any point on the microstrip transmission line from data acquired over many shots with variable delay. No evidence for significant pulse distortion by voltage reflections at the ends of the microstrip is observed. The measured profiles compare well to predictions by a time-dependent discrete dynode model down to the 1% level. The calculations do overestimate the contrast further into the temporal wings. The role of electron transit time dispersion in limiting the minimum achievable gate duration is then investigated by using variable duration flattop gating pulses. A minimum gate duration of 50 ps is achieved with flattop gating, consistent with a fractional transit time spread of {approx} 15%.

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