Complications in correlatability between test techniques due to directional emission patterns
- 20 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 2, 776-779
- https://doi.org/10.1109/isemc.1999.810117
Abstract
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This publication has 1 reference indexed in Scilit:
- Measurement uncertainty of radiated emissionsPublished by National Institute of Standards and Technology (NIST) ,1997