Atom probe field-ion microscopy: A technique for microstructural characterization of irradiated materials on the atomic scale
- 1 December 1989
- journal article
- research article
- Published by Springer Nature in Metallurgical Transactions A
- Vol. 20 (12) , 2651-2661
- https://doi.org/10.1007/bf02670158
Abstract
No abstract availableKeywords
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