Transport property of zero-gap semiconductors under tensile stress
- 15 September 1975
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 12 (6) , 2336-2345
- https://doi.org/10.1103/physrevb.12.2336
Abstract
The band structure of symmetry-induced zero-gap semiconductors under uniaxial tensile stress is studied. It is found that there exist regions in the reciprocal space where one component of the effective-mass tensor of either electrons or holes becomes negative. In particular, the anomalous region for holes can be made sufficiently large to allow for the occurrence of negative-differential-resistance (NDR) effect. The characteristics for -type and HgTe at both zero temperature and finite temperature (4.2 and 77°K) are obtained by simple transport calculations. From these calculated characteristics, one gets some idea about the sample requirements and magnitude of stress needed for NDR effect.
Keywords
This publication has 17 references indexed in Scilit:
- Negative—Differential-Resistance Effect in Zero-Gap SemiconductorsPhysical Review Letters, 1974
- Stress-Induced Band Gap and Related Phenomena in Gray TinPhysical Review B, 1972
- Ionized-Impurity-Limited Mobility and the Band Structure of Mercuric SelenidePhysical Review B, 1969
- Interband Magnetoreflection and Band Structure of HgTePhysical Review B, 1967
- Oscillatory Magnetoresistance in Mercuric SelenidePhysical Review B, 1965
- Band Structure of Gray TinPhysical Review Letters, 1963
- Cyclotron Resonance Experiments in Uniaxially Stressed Silicon: Valence Band Inverse Mass Parameters and Deformation PotentialsPhysical Review B, 1963
- The Possibility of Negative Resistance Effects in SemiconductorsProceedings of the Physical Society, 1961
- Proposal for Detection of Negative-Mass Carriers by Cyclotron ResonancePhysical Review Letters, 1958
- Proposed Negative-Mass Microwave AmplifierPhysical Review B, 1958