EFTEM Analysis of FIB Sections: An Important Tool in Nanotechnology
- 1 August 2005
- journal article
- research article
- Published by Oxford University Press (OUP) in Microscopy and Microanalysis
- Vol. 11 (S02) , 46-47
- https://doi.org/10.1017/s1431927605503428
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005Keywords
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