Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
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- 13 March 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 76 (11) , 1470-1472
- https://doi.org/10.1063/1.126067
Abstract
Atomic resolution by noncontact atomic force microscopy with a self-sensing piezoelectric force sensor is presented. The sensor has a stiffness of 1800 N/m and is operated with sub-nanometer amplitudes, allowing atomic resolution with relatively bluntly etched tungsten tips. Sensitivity and noise are discussedKeywords
This publication has 19 references indexed in Scilit:
- A low-temperature dynamic mode scanning force microscope operating in high magnetic fieldsReview of Scientific Instruments, 1999
- Calculation of the optimal imaging parameters for frequency modulation atomic force microscopyApplied Surface Science, 1999
- High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning forkApplied Physics Letters, 1998
- Forces and frequency shifts in atomic-resolution dynamic-force microscopyPhysical Review B, 1997
- Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7×7Physical Review B, 1996
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force MicroscopyJapanese Journal of Applied Physics, 1995
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Scanning near-field acoustic microscopyApplied Physics B Laser and Optics, 1989
- Atomic Force MicroscopePhysical Review Letters, 1986