Field-Emission Cold-Cathode EI Source for a Microscale Ion Trap Mass Spectrometer
- 1 February 2000
- journal article
- research article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 72 (3) , 559-562
- https://doi.org/10.1021/ac990962s
Abstract
A cold-cathode electron impact ionization source based on field emission from an array of diamond-coated silicon whiskers is described. The source is coupled to a microscale ion trap mass spectrometer (r0 = 0.50 mm, z0 = 0.50 mm). An electron beam of 250 nA could be obtained through the 0.45-mm diameter opening in the end cap electrode.Keywords
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