Der Einfluß einer streuenden Phasenplatte auf das elektronenmikroskopische Bild

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Abstract
Using carbon films for phase shifting in the focal plane of the objective one has to consider the decrease of the coherent part of the electron beam. Only the unscattered part contributes to the phase contrast. After passing a 90.8 nm carbon film with a phase shift of 2 π the coherent amplitude decreases to 47%. But using a phase plate of different thickness for shifting all scattered electrons like a Zernike λ/4-plate, there will be a larger increase of contrast in images of platinum and carbon atoms than by optimal defocussing phase contrast. Calculations of phase shift and decrease of zero beam amplitude up to 1 MeV are reported. The use of Be-films with lower scattering cross section offers no large advantage.

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