Low-temperature sample-rotating cryostat with two degrees of freedom for measuring the anisotropy of the upper critical field of superconductors
- 1 May 1988
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 59 (5) , 776-777
- https://doi.org/10.1063/1.1139827
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A temperature-variable sample rotating cryostat in high magnetic fieldsCryogenics, 1983
- UHV-manipulator attachment for azimuthal sample rotation with electrical readoutReview of Scientific Instruments, 1978
- Low-temperature sample orienting device with two degrees of freedomReview of Scientific Instruments, 1978
- Low temperature sample holders that provide rotation about two orthogonal axesReview of Scientific Instruments, 1976