Degradation of native oxide passivated silicon photodiodes by repeated oxide bias
- 15 January 1984
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 55 (2) , 406-412
- https://doi.org/10.1063/1.333088
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Spectral response self-calibration and interpolation of silicon photodiodesApplied Optics, 1980
- Silicon photodiode absolute spectral response self-calibrationApplied Optics, 1980
- Quantum efficiency of the p-n junction in silicon as an absolute radiometric standardApplied Optics, 1979