Comparison and trends in today's dominant E2technologies

• 1 January 1986
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 580-583
• https://doi.org/10.1109/iedm.1986.191256

Abstract

Keywords

• DIELECTRICS
• EPROM
• TUNNELING
• APPLICATION SPECIFIC INTEGRATED CIRCUIT
• ELECTRONS
• NONVOLATILE MEMORY