Multiple Fault Detection in Combinational Networks
- 1 January 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-21 (1) , 31-36
- https://doi.org/10.1109/t-c.1972.223428
Abstract
Combinational networks with no internal fan-out are considered from the point of view of testing for multiple faults. Several different approaches utilizing added inputs and observable outputs are considered and the tradeoffs are discussed.Keywords
This publication has 2 references indexed in Scilit:
- A New Representation for Faults in Combinational Digital CircuitsIEEE Transactions on Computers, 1972
- Fault Detection in Redundant CircuitsIEEE Transactions on Electronic Computers, 1967