Ion multiple scattering: A tool for studying the thickness topography of self-supporting targets
- 15 March 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 194 (1) , 81-85
- https://doi.org/10.1016/0029-554x(82)90494-3
Abstract
No abstract availableKeywords
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